The reliability of a semiconductor device is determined by its ability to perform its required functions under the stipulated conditions for a finite period of time. Quantifiable yardsticks such as the reliability rate, failure rate, and mean time to failure (MTTF) are used to measure reliability.

Customers naturally expect semiconductor devices to perform the required functions from the moment they are first used, and they also expect the devices to function without failure throughout the expected period of use.

The objective of reliability testing is to confirm a semiconductor device's fault-free operation and estimated useful life by exposing the device to accelerated or marginal stress, based on the amount of stress (thermal stress, mechanical stress, electrical stress etc) that the device is estimated to undergo during manufacture, shipping and normal use.

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